HAST High Pressure Accelerated Aging Test Chamber, PCT High Pressure Accelerated Aging Test Chamber and Low Pressure Test Chamber can be collectively referred to as environmental simulation test chambers. They are all used to simulate pressure, temperature, humidity and other factors under different environmental conditions to test and evaluate the performance and reliability of products under specific environments.
Below are the specific applications and functions of these chambers:
HAST Highly Accelerated Stress Test (HAST):
Uses high temperature, high humidity and high pressure environments to accelerate the reliability of test products.
Mainly used for semiconductors, electronic components, circuit boards and other electronic products, can quickly find potential manufacturing defects.
The HAST test can significantly reduce the time required for conventional hot and humid tests (e.g. 85°C/85% RH).
PCT High Pressure Accelerated Aging Test Chamber (Pressure Cooker Test):
Similar to HAST, PCT uses high temperatures, humidity and pressure to accelerate material ageing.
PCT is more commonly used to simulate extreme environmental conditions to test the hermeticity and long-term reliability of products.
This test method is commonly used for encapsulated electronics, such as packaged chips, and other components that require a high degree of hermeticity.
Altitude Chamber / Hypobaric Chamber：
Used to simulate low pressure environments at high altitude conditions.
It is primarily used to test aerospace equipment, electronics, military equipment, etc., for performance in high altitude or aerospace environments.
Tests include electrical performance, physical deformation, mechanical failure, etc., in a low-pressure environment.
These chambers help manufacturers assess the reliability of their products over their expected service life by simulating the accelerated aging process, identifying and resolving potential problems in a timely manner, and ensuring the high quality and durability of their products.
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